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1

Effects of O2 plasma treatment on the electric and dielectric characteristics of Ba0.7Sr0.3TiO3 thin films

Ching-Chich Leu, Shih-Hsiung Chan, Haur-Ywh Chen, Ray-Hua Horng, Dong-Sing Wuu, Luh-Huei Wu, Tiao-Yuan Huang, Chun-Yen Chang, Simon Min Sze

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 200 KB

english, 2000

2

[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Film-profile-engineered IGZO thin-film transistors with gate/drain offset for high voltage operation

Wu, Ming-Hung, Lin, Horng-Chih, Li, Pei-Wen, Huang, Tiao-Yuan

Year:

2016

Language:

english

File:

PDF, 1.22 MB

english, 2016

3

A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO2/poly-gate complementary metal oxide semiconductor technology

Wu-Te Weng, Yao-Jen Lee, Horng-Chih Lin, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.34 MB

english, 2010

4

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Film profile engineering (FPE): A new concept for manufacturing of short-channel metal oxide TFTs

Lyu, Rong-Jhe, Lin, Horng-Chih, Wu, Ming-Hung, Shie, Bo-Shiuan, Hung, Hsiang-Ting, Huang, Tiao-Yuan

Year:

2013

Language:

english

File:

PDF, 997 KB

english, 2013

5

Submicron organic thin-film transistors fabricated by film profile engineering method

Wu, Ming-Hung, Lin, Horng-Chih, Lin, Hung-Cheng, Zan, Hsiao-Wen, Meng, Hsin-Fei, Huang, Tiao-Yuan

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.10 MB

english, 2014

6

Thermal Performance Investigation for Confined Heat Sinks By Using a Modified Transient Liquid Crystal Technique

Wu, Ming-Chang, Wu, Tiao-Yuan, Kuo, Sheng-Tzung, Wang, Meng-Ping, Hung, Ying-Huei

Journal:

Journal of Electronic Packaging

Year:

2005

Language:

english

File:

PDF, 562 KB

english, 2005

7

Investigation of p-type junction-less independent double-gate poly-Si nano-strip transistors

Liu, Keng-Ming, Lin, Zer-Ming, Wu, Jiun-Peng, Lin, Horng-Chih, Huang, Tiao-Yuan

Journal:

Semiconductor Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

8

A novel self-aligned T-shaped gate process for deep submicron Si MOSFET's fabrication

Horng-Chih Lin,, Lin, R., Wen-Fa Wu,, Rong-Png Yang,, Ming-Shih Tsai,, Tien-Sheng Chao,, Tiao-Yuan Huang,

Journal:

IEEE Electron Device Letters

Year:

1998

Language:

english

File:

PDF, 54 KB

english, 1998

9

Reduced reverse narrow channel effect in thin SOI nMOSFETs

Chun-Yen Chang,, Sun-Jay Chang,, Tien-Sheng Chao,, Sung-Dtr Wu,, Tiao-Yuan Huang,

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 60 KB

english, 2000

10

A new self-aligned subtractive gate process for high-voltage and complementary polycrystalline silicon thin-film transistors

Wu, I-Wei, Huang, Tiao-Yuan, Lewis, Alan G., Chuang, T. C., Chiang, Anne

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 421 KB

english, 1990

11

A MOS Transistor with self-aligned polysilicon source—drain

Tiao-Yuan Huang,, I-Wei Wu,, Chen, J.Y.

Journal:

IEEE Electron Device Letters

Year:

1986

Language:

english

File:

PDF, 369 KB

english, 1986

12

[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - AC-SONOS: a single-poly, assist-charge induced source-side-injection SONOS low power nonvolatile memory

Ming-Hsiu Lee,, Jau-Yi Wu,, Ming-Chang Kuo,, Tzu-Hsuan Hsu,, Hsiang-Lan Lung,, Tiao-Yuan Huang,, Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 241 KB

english, 2005

13

Plasma-Induced Damage on the Reliability of Hf-Based High-k/Dual Metal-Gates Complementary Metal Oxide Semiconductor Technology

Weng, Wu-Te, Lee, Yao-Jen, Lin, Horng-Chih, Huang, Tiao-Yuan

Journal:

International Journal of Plasma Science and Engineering

Year:

2009

Language:

english

File:

PDF, 559 KB

english, 2009

14

Novel InGaZnO inverters utilizing film profile engineering

Lin, Horng-Chih, Wu, Ming-Hung, Chan, Chin-Wen, Lyu, Rong-Jhe, Huang, Tiao-Yuan

Journal:

Japanese Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 954 KB

english, 2015

15

Effects of Plasma Damage on Metal–Insulator–Metal Capacitors and Transistors for Advanced Mixed-Signal/Radio-Frequency Metal–Oxide–Semiconductor Field-Effect Transistor Technology

Weng, Wu-Te, Lee, Yao-Jen, Lin, Hong-Chih, Huang, Tiao-Yuan

Journal:

Japanese Journal of Applied Physics

Year:

2009

File:

PDF, 1.12 MB

2009

16

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Characterization and modeling of out-diffusion of cesium, manganese, and zinc impurities from deep-ultraviolet photoresist

Ko, Fu-Hsiang, Wang, Mei-Ya, Wang, Tien-Ko, Yang, ChinCheng, Huang, Tiao-Yuan, Wu, ChengSan, Sullivan, Neal T.

Year:

2000

Language:

english

File:

PDF, 323 KB

english, 2000

17

3D dynamic thermal and thermomechanical stress analysis of a hot blast stove

Gan, Yu-Feng, Jang, Jiin-Yuh, Wu, Tiao-Yuan

Journal:

Iron and Steelmaking

Year:

2019

Language:

english

File:

PDF, 4.94 MB

english, 2019